Warning: Under construction!

generic 3200FS image

Our JEOL JEM 3200FS transmission electron microscope (TEM) is an intermediate voltage (300 kV) electron microscope similar to the one shown in this image from the JEOL USA website. This electron microscope uses a thermal field emission gun (FEG) as its electron source, providing an extremely bright and coherent beam of electrons for use in imaging and analysis.

The 3200FS installed in Simon Hall during the last half of 2008 is equipped with an in-column energy filter and a Gatan UltraScan 4000 CCD camera. Note that the 3200FS is a different instrument from the JEOL JEM 3200FSC, which is the liquid helium cooled 300 kV TEM found in cryoEM facilities such the New York Structural Biology Center (NYSBC) and the National Center for Macromolecular Imaging (NCMI).

In addition to the TEM capabilities of the 3200FS, our instrument is also equipped with scan coils and detectors that allow it to function as a scanning transmission electron microscope (STEM). The dual capabilities of TEM and STEM makes such instruments significantly different from dedicated STEM machines like the Hitachi HD2700C or the VG HB501, and the designation (S)TEM or S/TEM is sometimes used to indicate that an instrument is capable of both STEM and TEM imaging.

In terms of physical appearance, the greatest differences between the instrument show here and our 3200FS are the presence of an Oxford EDS detector high on the right side of the column and a TV monitor to the left of the column for the TV rate camera located below the bottom-mount Gatan CCD camera. In addition, we have a pair of equal-sized computer monitors (instead of the smaller and larger ones shown above) connected to a PC that is in turn connected to the 3200FS's microprocessor.

In addition to the PC driving these monitors, there is a second (dual-monitor) PC connected to the Gatan UltraScan 4000 CCD camera and to DigiScan (Gatan's STEM control unit), and a third PC connected to the Oxford EDS detector. These PCs and their monitors are housed in a unit to the immediate right of the 3200FS and within easy reach of the operator. This bank of monitors is controlled by either the keyboard and mouse on the console of the 3200FS or the additional keyboard and mouse on this second desktop.

View of our 3200FS

 

Field Emission Gun (FEG):

 


Transmission Electron Microscopy (TEM) Imaging:

 


Gatan UltraScan 4000 CCD Camera:

ultrascan logoThe 3200FS has a 4k x 4k Gatan UltraScan 4000 CCD camera mounted below the camera chamber. This camera has a dynamic range of 16-bits and utlizes 15 micrometer pixels with a 4 port readout. The multi-port readout makes it possible to record a full 4k x 4k image within 10-12 s (i.e., approaching the ease and speed of recording onto film), meaning that more time is spent examining the specimen and adjusting imaging conditions while less time is spent actually recording the images.

We have not explicitly determined either the modulation transfer function (MTF) or detector quantum efficiency (DQE) of this camera, but the images shown here demonstrate that there is considerable signal near the Nyquist frequency in 4k x 4k images recorded using the UltraScan camera.


In-column Energy Filter (aka "Omega Filter"):

Energy filters for EFTEM and EELS can be placed in two fundamentally different locations along the electron optics of any given electron microscope:

The 3200FS uses an in-column filter that can be controlled either by TEMcon (JEOL's software that talks directly to the 3200FS) or by DigitalMicrograph (Gatan's software that talks to the microscope and to the various detectors attached to it). In addition to the software control for the detailed behaviour of the energy filter, there are several knobs and buttons on the left-hand knobset that control some fundamental aspects of the filter (i.e., whether the slit is inserted or not, the applied energy offset, etc.).

This ~30 cm long in-column filter is located just above the specimen chamber and is the main reason that the airlock for introducing specimens into the column of the 3200FS is more than 2 meters from the floor!


Electron Energy Loss Spectroscopy (EELS):

 


Scanning Transmission Electron Microscope (STEM) Imaging:

 


Energy Dispersive X-Ray Spectroscopy (aka EDS, EDX or EDXS):

 


STEM combined with EELS or EDS:

 


diagram of computer connectionsComputers associated with the 3200FS:

As mentioned above and in several additional places on these web pages, the 3200FS is connected to a number of computers. The microscope itself has a microprocessor (referred to as the "VME") that controls its hardware (high tension, vacuum system, stage, apertures, etc.). This layer of computing is mostly invisible to the user, though there are certain occasions and conditions where it is important to understand that it exists and to make sure it is functioning properly.

There are three PCs which make up the conventional "user interface" to the 3200FS (and it's cameras/detectors) and two additional PCs that add functionality to the 3200FS and its computers. The diagram to the right shows how these computers are connected and highlights the fact that the only "internet connection" to the 3200FS is a dedicated line running from the 3200FS to the JEOL PC (described immediately below).

Note: Because of all these interconnections between the PCs, the various cameras and detectors and the 3200FS itself, please do not attempt to reboot any of these machines. If you think that is necessary, please contact the director.

In addition to the three PCs that are in the room with the 3200FS, there are two other PCs involved in the daily operations of the 3200FS: